[IEEE 2020 Device Research Conference (DRC) - Columbus, OH,...

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[IEEE 2020 Device Research Conference (DRC) - Columbus, OH, USA (2020.6.21-2020.6.24)] 2020 Device Research Conference (DRC) - Mobility Enhancement and Reliability Characterization of Back-Channel-Etch Amorphous InGaZnO TFT with Double Layers

Yen, Chia-Chun, Tai, An-Hung, Liu, Yu-Chieh, Yeh, Chun-Hung, Liu, C. W.
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Year:
2020
DOI:
10.1109/drc50226.2020.9135180
File:
PDF, 2.51 MB
2020
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