![](/img/cover-not-exists.png)
[IEEE 2020 Device Research Conference (DRC) - Columbus, OH, USA (2020.6.21-2020.6.24)] 2020 Device Research Conference (DRC) - Mobility Enhancement and Reliability Characterization of Back-Channel-Etch Amorphous InGaZnO TFT with Double Layers
Yen, Chia-Chun, Tai, An-Hung, Liu, Yu-Chieh, Yeh, Chun-Hung, Liu, C. W.Year:
2020
DOI:
10.1109/drc50226.2020.9135180
File:
PDF, 2.51 MB
2020