[IEEE 2020 IEEE International Reliability Physics Symposium...

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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Reliability and Robustness Performance of 1200 V SiC DMOSFETs

Sundaresan, Siddarth, Mulpuri, Vamsi, Park, Jaehoon, Singh, Ranbir
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Year:
2020
DOI:
10.1109/irps45951.2020.9128225
File:
PDF, 898 KB
2020
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