[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing
Lee, C-S., Vaitheeswaran, P., Subbarayan, G., Park, Y-J., Chung, J., Krishnan, S.Year:
2020
DOI:
10.1109/irps45951.2020.9128331
File:
PDF, 972 KB
2020