[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping
Ruch, Bernhard, Pobegen, Gregor, Schleich, Christian, Grasser, TiborYear:
2020
DOI:
10.1109/irps45951.2020.9129513
File:
PDF, 1.02 MB
2020