[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices
Kranthi, Nagothu Karmel, Sampath Kumar, B., Salman, Akram, Boselli, Gianluca, Shrivastava, MayankYear:
2020
DOI:
10.1109/irps45951.2020.9129624
File:
PDF, 974 KB
2020