[IEEE 2020 IEEE International Reliability Physics Symposium...

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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices

Kranthi, Nagothu Karmel, Sampath Kumar, B., Salman, Akram, Boselli, Gianluca, Shrivastava, Mayank
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Year:
2020
DOI:
10.1109/irps45951.2020.9129624
File:
PDF, 974 KB
2020
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