[IEEE 2020 IEEE 38th VLSI Test Symposium (VTS) - San Diego,...

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[IEEE 2020 IEEE 38th VLSI Test Symposium (VTS) - San Diego, CA, USA (2020.4.5-2020.4.8)] 2020 IEEE 38th VLSI Test Symposium (VTS) - On Classification of Acceptable Images for Reliable Artificial Intelligence Systems: A Case Study on Pedestrian Detection

Hsieh, Tong-Yu, Wu, Pin-Xuan, Cheng, Chun-Chao
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Year:
2020
DOI:
10.1109/vts48691.2020.9107565
File:
PDF, 924 KB
2020
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