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Structural and electrical characteristics of high-performance stacked YbTixOy/PbZr0.53Ti0.47O3 gate dielectrics for InGaZnO thin-film transistors
Pan, Tung-Ming, Wang, Hung-Chun, Her, Jim-LongVolume:
842
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2020.155844
Date:
November, 2020
File:
PDF, 2.67 MB
2020