Electron energy loss spectroscopy and energy filtered transmission electron microscopy of hydrogenated nano-crystalline Si thin films deposited via hydrogen profiling during hot-wire CVD for application in photovoltaics
Cummings, Franscious, van Heerden, Brian, Arendse, Christopher, Muller, TheophillusJournal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2020.03.520
Date:
April, 2020
File:
PDF, 3.35 MB
2020