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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology
Su, C.-Y., Armstrong, M., Chugh, S., El-tanani, M., Greve, H., Li, H., Maksud, M., Orr, B., Perini, C., Palmer, J., Paulson, L., Ramey, S., Waldemer, J., Yang, Y., Young, D.Year:
2020
DOI:
10.1109/IRPS45951.2020.9128314
File:
PDF, 306 KB
2020