Memory Behavior of an Al2O3 Gate Dielectric Non-Volatile...

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IEEE Electron Device Letters 2020

Memory Behavior of an Al2O3 Gate Dielectric Non-Volatile Field-Effect Transistor

Peng, Yue, Xiao, Wenwu, Han, Genquan, Liu, Yan, Liu, Fenning, Liu, Chen, Zhou, Yichun, Yang, Nan, Zhong, Ni, Duan, Chungang, Hao, Yue
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Year:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.3010363
File:
PDF, 601 KB
2020
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