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Numerical Solutions for Electric Field Lines and Breakdown Voltages in Superjunction-Like Power Devices
Huang, Haimeng, Hu, Ke, Xu, Wenjia, Xu, Shaodi, Cui, Wentao, Zhang, Weijia, Ng, Wai TungYear:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3007598
File:
PDF, 775 KB
2020