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[IEEE 2019 4th IEEE Workshop on the Electronic Grid (eGRID) - Xiamen, China (2019.11.11-2019.11.14)] 2019 4th IEEE Workshop on the Electronic Grid (eGRID) - Influence of Stray Capacitance on Dynamic Test Results of Power Semiconductor devices
Tang, Xinling, Zhang, Yu, Sai, Zhaoyang, Han, Ronggang, Wu, Junmin, Pan, YanYear:
2019
DOI:
10.1109/egrid48402.2019.9092756
File:
PDF, 1.07 MB
2019