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[IEEE 2019 IEEE International Conference on Electro Information Technology (EIT) - Brookings, SD, USA (2019.5.20-2019.5.22)] 2019 IEEE International Conference on Electro Information Technology (EIT) - Comparing classification accuracy of NDVI with DEM derived attributes using multi-scalar approach in Geographic Information Systems
Gomes, Rahul, Denton, Anne, Franzen, DavidYear:
2019
DOI:
10.1109/eit.2019.8833766
File:
PDF, 1.32 MB
2019