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[IEEE 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - Edinburgh, United Kingdom (2020.5.4-2020.5.18)] 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - A Rapid, Reliable and Less-destructive On-chip Mass Measurement for 3D Composite Material Testing Microstructures
Hwang, Gilgueng, David, Christophe, Paris, Alisier, Decanini, Dominique, Mizushima, Ayako, Mita, YoshioYear:
2020
DOI:
10.1109/icmts48187.2020.9107932
File:
PDF, 278 KB
2020