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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Dynamic vs Static Burn-in for 16nm Production
Zhang, Jeffrey, Xu, Antai, Gitlin, Daniel, Yeo, DesmondYear:
2020
DOI:
10.1109/irps45951.2020.9128338
File:
PDF, 375 KB
2020