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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Over-Voltage Protection on the CC Pin of USB Type-C Interface against Electrical Overstress Events
Ke, Chao-Yang, Ker, Ming-DouYear:
2020
DOI:
10.1109/irps45951.2020.9129160
File:
PDF, 1.69 MB
2020