[IEEE 2019 International SoC Design Conference (ISOCC) -...

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[IEEE 2019 International SoC Design Conference (ISOCC) - Jeju, Korea (South) (2019.10.6-2019.10.9)] 2019 International SoC Design Conference (ISOCC) - An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

Lim, Hyeonchan, Jang, Seokjun, Kim, Seunghwan, Kang, Sungho
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Year:
2019
DOI:
10.1109/isocc47750.2019.9078517
File:
PDF, 471 KB
2019
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