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[IEEE 2019 IEEE International Scientific-Practical Conference Problems of Infocommunications, Science and Technology (PIC S&T) - Kyiv, Ukraine (2019.10.8-2019.10.11)] 2019 IEEE International Scientific-Practical Conference Problems of Infocommunications, Science and Technology (PIC S&T) - Assessment of Measurement Uncertainty of the Uncinated Process and Middle Nasal Concha in Spiral Computed Tomography Data
Nechyporenko, Alina, Reshetnik, Viktor, Alekseeva, Victoriia, Yurevych, Nadiia, Nazaryan, Rosana, Gargin, VitaliyYear:
2019
DOI:
10.1109/picst47496.2019.9061557
File:
PDF, 1.50 MB
2019