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Influences of different barrier films on microstructures and electrical properties of Bi2Te3-based joints
Cheng, Jinxuan, Hu, Xiaowu, Li, QinglinJournal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-020-04035-w
Date:
July, 2020
File:
PDF, 3.69 MB
2020