Multilayer InSe-Te van der Waals heterostructures with ultrahigh rectification ratio and ultrasensitive photoresponse
Qin, Fanglu, Gao, Feng, Dai, Mingjin, Hu, Yunxia, Yu, Miaomiao, Wang, Lifeng, Feng, Wei, Li, Bin, Hu, PingAnJournal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.0c08461
Date:
July, 2020
File:
PDF, 828 KB
2020