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[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Modeling Static Noise Margin for FinFET based SRAM PUFs
Masoumian, Shayesteh, Selimis, Georgios, Maes, Roel, Schrijen, Geert-Jan, Hamdioui, Said, Taouil, MottaqiallahYear:
2020
DOI:
10.1109/ETS48528.2020.9131583
File:
PDF, 355 KB
2020