[IEEE 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Dubrovnik, Croatia (2020.5.25-2020.5.28)] 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Signal-to-Noise Ratio Contributors and Effects in Proximal Near-Infrared Spectral Reflectance Measurement on Plant Leaves
Holmes, Wayne S., Po-Leen Ooi, Melanie, Kuang, Ye Chow, Simpkin, Ray, Blanchon, Dan, Gupta, Gourab Sen, Demidenko, SergeYear:
2020
DOI:
10.1109/I2MTC43012.2020.9129359
File:
PDF, 1.21 MB
2020