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Fundamental Thermal Limits on Data Retention in Low-Voltage CMOS Latches and SRAM
Rezaei, Elahe, Donato, Marco, Patterson, William R., Zaslavsky, Alexander, Bahar, R. IrisYear:
2020
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2020.2996627
File:
PDF, 7.23 MB
2020