[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Test Sequence-Optimized BIST for Automotive Applications
Kaczmarek, Bartosz, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Rybak, Lukasz, Tyszer, JerzyYear:
2020
DOI:
10.1109/ets48528.2020.9131585
File:
PDF, 2.47 MB
2020