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[IEEE 2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Changsha, China (2019.11.1-2019.11.3)] 2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Finite element simulation analysis of influencing factors in near field eddy current testing
Wei, Zhang, Yanjun, Li, Yibing, Shi, Siwei, Xiao, Zhipeng, LiYear:
2019
DOI:
10.1109/icemi46757.2019.9101695
File:
PDF, 449 KB
2019