![](/img/cover-not-exists.png)
[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Two-Regime Drift in Electrolytically Gated FETs and BioFETs
Wuytens, R., Santermans, S., Gupta, M., Bois, B. Du, Severi, S., Lagae, L., Roy, W. Van, Martens, K. M.Year:
2020
DOI:
10.1109/irps45951.2020.9129124
File:
PDF, 661 KB
2020