[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - On the Correlation of Laser-induced and High-Energy Proton Beam-induced Single Event Latchup
Ajdari, Bahar, Sekwao, Samwel, Ascazubi, Ricardo, Neale, Adam, Seifert, NorbertYear:
2020
DOI:
10.1109/irps45951.2020.9129592
File:
PDF, 732 KB
2020