[IEEE 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) - Iowa City, IA, USA (2020.4.3-2020.4.7)] 2020 IEEE 17th International Symposium on Biomedical Imaging (ISBI) - Weakly Supervised Vulnerable Plaques Detection by IVOCT Image
Shi, Peiwen, Xin, Jingmin, Zheng, NanningYear:
2020
DOI:
10.1109/isbi45749.2020.9098468
File:
PDF, 521 KB
2020