[IEEE 2020 IEEE International Workshop on Metrology for...

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[IEEE 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) - Roma, Italy (2020.6.3-2020.6.5)] 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT - Introducing a survey methodology for assessing LoRaWAN coverage in Smart Campus scenarios

Alves, Hudson B. M., Lima, Vinicius S. S., Silva, Diego R. C., Nogueira, Marcelo B., Rodrigues, Marconi C., Cunha, Rafael N., Carvalho, Dhiego Fernandes, Sisinni, Emiliano, Ferrari, Paolo
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Year:
2020
DOI:
10.1109/metroind4.0iot48571.2020.9138300
File:
PDF, 494 KB
2020
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