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[IEEE 2019 32nd IEEE International System-on-Chip Conference (SOCC) - Singapore (2019.9.3-2019.9.6)] 2019 32nd IEEE International System-on-Chip Conference (SOCC) - Timing Aware Wrapper Cells Reduction for Pre-bond Testing in 3D-ICs
Ho, Pei-An, Chen, Yen-Hao, Wu, Allen C.-H., Hwang, TingTingYear:
2019
DOI:
10.1109/socc46988.2019.1570544200
File:
PDF, 143 KB
2019