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Investigation of optoelectronic properties in germanium nanowire integrated silicon substrate using kelvin probe force microscopy
Singh, H Manas, Choudhuri, Bijit, Chinnamuthu, PYear:
2020
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2020.3010691
File:
PDF, 908 KB
2020