Pattern Detection Model Using a Deep Learning Algorithm for Power Data Analysis in Abnormal Conditions
Lee, Jeong-Hee, Kang, Jongseok, Shim, We, Chung, Hyun-Sang, Sung, Tae-EungVolume:
9
Journal:
Electronics
DOI:
10.3390/electronics9071140
Date:
July, 2020
File:
PDF, 3.47 MB
2020