Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps
Winkelmann, Aimo, Nolze, Gert, Cios, Grzegorz, Tokarski, Tomasz, BaÅa, PiotrVolume:
13
Journal:
Materials
DOI:
10.3390/ma13122816
Date:
June, 2020
File:
PDF, 8.65 MB
2020