[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs
Monishmurali, M, Paul, Milova, Shrivastava, MayankYear:
2020
DOI:
10.1109/irps45951.2020.9129356
File:
PDF, 1.37 MB
2020