[IEEE 2020 IEEE International Reliability Physics Symposium...

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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs

Monishmurali, M, Paul, Milova, Shrivastava, Mayank
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Year:
2020
DOI:
10.1109/irps45951.2020.9129356
File:
PDF, 1.37 MB
2020
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