Morphological engineering of novel nanocrystalline...

Materials Science in Semiconductor Processing 2020 / 12 Vol. 120

Morphological engineering of novel nanocrystalline Cu2Sn(S,Se)3 thin film through annealing temperature variation: Assessment of photoelectrochemical cell performance

Joshi, Monika P., Mali, Sawanta S., Hong, Chang Kook, Bhosale, Popatrao N.
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Volume:
120
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2020.105218
Date:
December, 2020
File:
PDF, 17.62 MB
2020
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