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Guidelines for Ferroelectric FET Reliability Optimization: Charge Matching
Deng, Shan, Liu, Zhan, Li, Xueqing, Ma, T. P., Ni, KaiYear:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.3011037
File:
PDF, 1.91 MB
2020