Correlated Time-0 and Hot-Carrier Stress Induced FinFET...

Micromachines 2020 / 06 Vol. 11; Iss. 7

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach

Makarov, Alexander, Roussel, Philippe, Bury, Erik, Vandemaele, Michiel, Spessot, Alessio, Linten, Dimitri, Kaczer, Ben, Tyaginov, Stanislav
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
11
Journal:
Micromachines
DOI:
10.3390/mi11070657
Date:
June, 2020
File:
PDF, 2.77 MB
2020
Conversion to is in progress
Conversion to is failed