Polarization-Charge Inversion at Al2O3/GaN Interfaces...

Polarization-Charge Inversion at Al2O3/GaN Interfaces through Post-Deposition Annealing

Kim, Kwangeun, Jang, Jaewon
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Volume:
9
Journal:
Electronics
DOI:
10.3390/electronics9071068
Date:
June, 2020
File:
PDF, 1.57 MB
2020
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