Localization of Small Anomalies via the Orthogonality...

Localization of Small Anomalies via the Orthogonality Sampling Method from Scattering Parameters

Chae, Seongje, Ahn, Chi Young, Park, Won-Kwang
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Volume:
9
Journal:
Electronics
DOI:
10.3390/electronics9071119
Date:
July, 2020
File:
PDF, 1.06 MB
2020
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