Effect of Anion Composition on the Bias Stress Stability in...

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IEEE Electron Device Letters 2020

Effect of Anion Composition on the Bias Stress Stability in Zn–O–N Thin-Film Transistors

Jang, Jun Tae, Kim, Hyoung-Do, Kim, Dong Myong, Choi, Sung-Jin, Kim, Hyun-Suk, Kim, Dae Hwan
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Year:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.3012465
File:
PDF, 847 KB
2020
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