Rapid defect characterization: The efficiency of...

Rapid defect characterization: The efficiency of diffraction contrast‐scanning transmission electron microscopy

Wang, Lingling, Shi, Ruikai, Lu, Yuan, Yu, Yi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Journal:
Microscopy Research and Technique
DOI:
10.1002/jemt.23556
Date:
July, 2020
File:
PDF, 2.48 MB
2020
Conversion to is in progress
Conversion to is failed