Thickness determination of metal multilayers by ED-XRF multivariate analysis using Monte Carlo simulated standards
Giurlani, Walter, Berretti, Enrico, Lavacchi, Alessandro, Innocenti, MassimoJournal:
Analytica Chimica Acta
DOI:
10.1016/j.aca.2020.07.047
Date:
July, 2020
File:
PDF, 3.12 MB
2020