Dimensional artefacts to achieve metrological traceability in advanced manufacturing
Carmignato, S., De Chiffre, L., Bosse, H., Leach, R.K., Balsamo, A., Estler, W.T.Journal:
CIRP Annals
DOI:
10.1016/j.cirp.2020.05.009
Date:
June, 2020
File:
PDF, 6.11 MB
2020