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[IEEE 2020 American Control Conference (ACC) - Denver, CO, USA (2020.7.1-2020.7.3)] 2020 American Control Conference (ACC) - High-speed large-range dynamic-mode atomic force microscope imaging: Adaptive tapping approach via Field Programmable Gate Array
Chen, Jiarong, Zou, QingzeYear:
2020
DOI:
10.23919/ACC45564.2020.9147315
File:
PDF, 1.87 MB
2020