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In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN
Yamaguchi, Tomohiro, Sasaki, Takuo, Fujikawa, Seiji, Takahasi, Masamitu, Araki, Tsutomu, Onuma, Takeyoshi, Honda, Tohru, Nanishi, YasushiVolume:
9
Journal:
Crystals
DOI:
10.3390/cryst9120631
Date:
November, 2019
File:
PDF, 1.89 MB
2019