[IEEE 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - Seattle, WA, USA (2020.6.14-2020.6.19)] 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) - DeepFake Detection by Analyzing Convolutional Traces
Guarnera, Luca, Giudice, Oliver, Battiato, SebastianoYear:
2020
DOI:
10.1109/CVPRW50498.2020.00341
File:
PDF, 642 KB
2020