[IEEE 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Chemal, Russia (2020.6.29-2020.7.3)] 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - TEM cell for Testing Low-profile Integrated Circuits for EMC
Demakov, Alexander V., Komnatnov, Maxim E.Year:
2020
DOI:
10.1109/EDM49804.2020.9153508
File:
PDF, 645 KB
2020