Performance Degradation of Automotive Power MOSFETs under...

  • Main
  • 2020
  • Performance Degradation of Automotive Power MOSFETs under...

Performance Degradation of Automotive Power MOSFETs under Repetitive Avalanche Breakdown Test

Xu, Chi, Yang, Fei, Ramadass, Yogesh, Akin, Bilal
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
Journal:
IEEE Transactions on Transportation Electrification
DOI:
10.1109/TTE.2020.3009093
File:
PDF, 1.89 MB
2020
Conversion to is in progress
Conversion to is failed