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Performance Degradation of Automotive Power MOSFETs under Repetitive Avalanche Breakdown Test
Xu, Chi, Yang, Fei, Ramadass, Yogesh, Akin, BilalYear:
2020
Journal:
IEEE Transactions on Transportation Electrification
DOI:
10.1109/TTE.2020.3009093
File:
PDF, 1.89 MB
2020