Testable Subsystems Generation for Fault Detection and Isolation Using a Structural Matching Rank Algorithm Testability of an Electrical Circuit
Said, Alem, Hicham, Mokhtari, Mahdi, Ouziala, Djamel, BenazzouzVolume:
5
Journal:
Research Journal of Applied Sciences, Engineering and Technology
DOI:
10.19026/rjaset.5.4252
Date:
May, 2013
File:
PDF, 673 KB
2013