Soft Error Reliability Evaluation of Nanoscale Logic...

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Journal of Electronic Testing 2020 / 8

Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults

Cai, Shuo, He, Binyong, Wang, Weizheng, Liu, Peng, Yu, Fei, Yin, Lairong, Li, Bo
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Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-020-05898-x
Date:
August, 2020
File:
PDF, 1.44 MB
2020
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